Associate Professor Goumas Stefanos holds a Mathematics degree from the National and Kapodistrian University of Athens and a degree in Computer Science from the University of Crete. He also holds a Master’s degree (M.Sc.) and a Ph.D. of Electronic and Computer Engineering of the Technical University of Crete. He has taught many courses in Computer Science and Communications, as a Laboratory and Scientific Associate, in several Departments of TEI of Crete. He has also taught several courses in Computer Science, Communications and Automated Control, as Lecturer PD. 407, in the Department of Electronic Engineering and Computer Engineering of the Technical University of Crete and in the Department of Production and Management Engineering of the Democritus University of Thrace.
Dr. Goumas has participated as a Researcher in several research projects and projects funded by the European Union. Also Dr. Goumas has published a significant number of articles in international scientific journals and prestigious conferences. His research interests include Vision Systems, Image and Signal and Image Analysis and Analysis, Wavelets for Signal Processing and Image Compression, Neural Networks, Fuzzy Logic, and Genetic Algorithms for Pattern Recognition Applications. Dr. Goumas is a member of the Hellenic Society of Scientists and Professionals of Informatics and Communications (SPS).
Dr. Goumas Stefanos teaches at the Department of Management Science & Technology of International Hellenic University undergratuate as well as postgraduate classes.
Contact details: International Hellenic University, Department of Management, Science & Technology, 65404, Kavala, Phone / FAX: +30 2510462318, Email: goumas@mst.ihu.gr
PUBLICATIONS
Papers published in International Journals:
1. S. K. Goumas, I. N. Dimou, and M. E. Ζervakis, Combination of Multiple Classifiers for Post Placement Quality Inspection of Components : A Comparative Study, Information Fusion, 11 (2010) 149 162.
2. M. Zervakis, S.K. Goumas, and G. A. Rovithakis, A Bayesian Framework for Multi-lead SMD Post-Placement Quality Inspection, IEEE Transactions on Systems, Man and Cybernetics, Part B: Cybernetics, vol. 34, no. 1, pp. 440-453, February 2004.
3. S.K. Goumas, M. E. Zervakis and G.S. Stavrakakis, Classification of Washing Machines Vibration Signals using Discrete Wavelet Analysis for Feature Extraction, IEEE Transactions on Instrumentation and Measurement, vol.51, no. 3, pp. 497-508, June 2002.
4. S.K. Goumas, M. E. Zervakis, A. Pouliezos, and G.S. Stavrakakis, Intelligent On-Line Quality Control of Washing Machines using Discrete Wavelet Analysis Features and Likelihood Classification International Scientific Journal Engineering Applications of Artificial Intelligence, Elsevier Science Ltd., Vol. 14, pp. 655-666, Oct.2001.
Papers published in Greek Journals:
1. Συμεωνίδης Συμεών, Γκούμας Στέφανος, Σαββίδου Κυριακή, Σχεδίαση και Ανάπτυξη Λογισμικού για τη Διδακτική Προσέγγιση της Ενότητας «Κόστος Παραγωγής», με τη βοήθεια της Visual Basic, Περιοδικό i-Teacher, ISSN: 1792 4146, 4ο Τεύχος, σελ. 84 92, Ιανουάριος 2012, http:// i-teacher.gr.
Αρθρα σε διεθνή επιστημονικά συνέδρια:
1. S. K. Goumas, M. E. Zervakis, and G. A. Rovithakis, Reduced Dimensionality Space for Post Placement Quality Inspection of Components based on Neural Networks, 12th European Symposium on Artificial Neural Networks – ESANN 2004, accepted for presentation during the symposium in the February 4, 2004.
2. S.K.Goumas, G. A. Rovithakis and M.E. Zervakis, A Bayesian Image Analysis Framework for Post Placement Quality Inspection of Components, Proceedings of 2002 IEEE International Conference on Image Processing – ICIP 2002, pp. II-549-552, September 22-25, 2002, Rochester, New York, USA.
3. S.K. Goumas, M. E. Zervakis, A. Pouliezos , G.S. Stavrakakis, E.P. Tomasini, N. Paone, L. Scalise, Intelligent On-Line Quality Control of Washing Machines using Discrete Wavelet Analysis Features and Likelihood Classification, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, Enrico Primo Tomasini, Editor, SPIE Vol. 4072 (21-23 June 2000, Ancona, Italy) p.p. 500-511.
Κεφάλαια σε βιβλία:
1. S.K. Goumas and M. E. Zervakis, Multi-Classifier Approaches for Post-Placement Surface-Mount Devices Quality Inspection, in Assemply Line Theory and Practice, edited by Waldemar Grzechca, September 2011, ISBN 978-953-307-995-0
